THEORETICAL STUDY OF THE EFFECT OF PROBE SHAPE ON ADHESION FORCE BETWEEN PROBE AND SUBSTRATE IN ATOMIC FORCE MICROSCOPE EXPERIMENT

被引:1
|
作者
Yang, Li [1 ]
Hu, Junhui [1 ]
Kong, Lingjiang [1 ]
机构
[1] Guangxi Normal Univ, Coll Phys Sci & Technol, Guilin, Peoples R China
基金
中国国家自然科学基金;
关键词
probe shape; adhesion force; van der Waals force; capillary force; relatively humidity; liquid bridge; CAPILLARY FORCE; SURFACES; MANIPULATION; ROUGHNESS; HUMIDITY; VAPORS; TIPS; AFM;
D O I
暂无
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
The quantitative description of adhesion force dependence on the probe shapes are of importance in many scientific and industrial fields. In order to elucidate how the adhesion force varied with the probe shape in atomic force microscope manipulation experiment, we performed a theoretical study of the influences of the probe shape (the sphere and parabolic probe) on the adhesion force at different humidity. We found that the combined action of the triple point and the Kelvin radius guiding the trend of the adhesion force, and these two fundamental parameters are closely related to the probe shape. Whilst, the theoretical results demonstrate that the adhesion force is in good agreement with the experiment data if the van der Waals force is taken into account.
引用
收藏
页码:235 / 241
页数:7
相关论文
共 50 条
  • [31] Improved atomic force microscope imaging in liquid with active probe
    Li, Yanning
    Zhao, Qianyun
    Wang, Zhongshun
    Fang, Xuan
    Song, Liwei
    Li, Shumin
    Fu, Xing
    Hu, Xiaotang
    Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University, 2006, 40 (03): : 341 - 343
  • [32] Imaging bandwidth of the tapping mode atomic force microscope probe
    Kokavecz, J
    Marti, O
    Heszler, P
    Mechler, A
    PHYSICAL REVIEW B, 2006, 73 (15)
  • [33] Fabrication of an all-metal atomic force microscope probe
    Rasmussen, JP
    Tang, PT
    Sander, C
    Hansen, O
    Moller, P
    TRANSDUCERS 97 - 1997 INTERNATIONAL CONFERENCE ON SOLID-STATE SENSORS AND ACTUATORS, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 1997, : 463 - 466
  • [34] Fabrication of a GaAs microwave probe used for atomic force microscope
    Ju, Yang
    Kobayashi, Tetsuya
    Soyama, Hitoshi
    IPACK 2007: PROCEEDINGS OF THE ASME INTERPACK CONFERENCE 2007, VOL 1, 2007, : 963 - 966
  • [35] Formation of Magnetic Nanostructures Using an Atomic Force Microscope Probe
    Temiryazev, A. G.
    Temiryazeva, M. P.
    Zdoroveyshchev, A., V
    Vikhrova, O. V.
    Nikulin, Yu, V
    Khivintsev, Yu, V
    Nikitov, S. A.
    TECHNICAL PHYSICS, 2019, 64 (11) : 1716 - 1721
  • [36] Flexoelectric control of beams with atomic force microscope probe excitation
    Zhang, Xufang
    Yu, Wen
    Fu, Jiahong
    Tzou, Hornsen
    PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART C-JOURNAL OF MECHANICAL ENGINEERING SCIENCE, 2020, 234 (13) : 2537 - 2549
  • [37] Measurement of the probe impact force of the atomic force microscope operating in the amplitude modulation mode
    B. O. Shcherbin
    A. V. Ankudinov
    A. V. Kiyuts
    O. S. Loboda
    Physics of the Solid State, 2014, 56 : 531 - 537
  • [38] Measurement of the probe impact force of the atomic force microscope operating in the amplitude modulation mode
    Shcherbin, B. O.
    Ankudinov, A. V.
    Kiyuts, A. V.
    Loboda, O. S.
    PHYSICS OF THE SOLID STATE, 2014, 56 (03) : 531 - 537
  • [39] A new atomic force microscope probe with force sensing integrated readout and active tip
    Onaran, AG
    Balantekin, M
    Lee, W
    Hughes, WL
    Buchine, BA
    Guldiken, RO
    Parlak, Z
    Quate, CF
    Degertekin, FL
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (02):
  • [40] On the adhesion between fine particles and nanocontacts: An atomic force microscope study
    Farshchi-Tabrizi, M
    Kappl, M
    Cheng, YJ
    Gutmann, J
    Butt, HJ
    LANGMUIR, 2006, 22 (05) : 2171 - 2184