Using Holography to Evaluate CCD Camera Characteristics with High Accuracy

被引：0
|
作者：
Voelkl, E. [1 ]
Tang, D. [2 ]
机构：
[1] FEI Co, Hillsboro, OR 97124 USA
[2] FEI Co, NL-5651 GG Eindhoven, Netherlands
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609097190
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：1100 / 1101
页数：2
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