Bi2Se3 Growth on (001) GaAs Substrates for Terahertz Integrated Systems

被引:4
|
作者
Liu, Yongchen [1 ]
Acuna, Wilder [1 ]
Zhang, Huairuo [2 ,3 ]
Ho, Dai Q. [1 ]
Hu, Ruiqi [1 ]
Wang, Zhengtianye [1 ]
Janotti, Anderson [1 ]
Bryant, Garnett [4 ]
Davydov, Albert V.
Zide, Joshua M. O. [1 ]
Law, Stephanie [1 ]
机构
[1] Univ Delaware, Dept Mat Sci & Engn, Newark, DE 19716 USA
[2] Natl Inst Stand & Technol, Mat Sci & Engn Div, Gaithersburg, MD 20899 USA
[3] Theiss Res Inc, La Jolla, CA 92037 USA
[4] Natl Inst Stand & Technol, Nanoscale Device Characterizat Div, Gaithersburg, MD 20899 USA
基金
美国国家科学基金会;
关键词
Bi2Se3; van der Waals materials; scanning transmission electron microscope; molecular beam epitaxy; GaAs/AlAs superlattice; ELECTRON LOCALIZATION; THIN-FILMS;
D O I
10.1021/acsami.2c11135
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Terahertz (THz) technologies have been of interest for many years due to the variety of applications including gas sensing, nonionizing imaging of biological systems, security and defense, and so forth. To date, scientists have used different classes of materials to perform different THz functions. However, to assemble an on-chip THz integrated system, we must understand how to integrate these different materials. Here, we explore the growth of Bi2Se3, a topological insulator material that could serve as a plasmonic waveguide in THz integrated devices, on technologically important GaAs(001) substrates. We explore surface treatments and find that an atomically smooth GaAs surface is critical to achieving high-quality Bi2Se3 films despite the relatively weak film/substrate interaction. Calculations indicate that the Bi2Se3/GaAs interface is likely selenium-terminated and shows no evidence of chemical bonding between the Bi2Se3 and the substrate. These results are a guide for integrating van der Waals materials with conventional semiconductor substrates and serve as the first steps toward achieving an on chip THz integrated system.
引用
收藏
页码:42683 / 42691
页数:9
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