Diffraction ring pattern and Z-scan measurement of amorphous As2S3 thin film

被引：0
|
作者：
Sohn, YJ [1 ]
Lee, YL [1 ]
Kwak, CH [1 ]
Choe, OS [1 ]
机构：
[1] YEUNGNAM UNIV,DEPT PHYS,KYONGSAN 712749,SOUTH KOREA
来源：
17TH CONGRESS OF THE INTERNATIONAL COMMISSION FOR OPTICS: OPTICS FOR SCIENCE AND NEW TECHNOLOGY, PTS 1 AND 2 | 1996年 / 2778卷
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
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页码：800 / 801
页数：2
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