Large-area, catalyst-free heteroepitaxy of InAs nanowires on Si by MOVPE

被引:18
|
作者
Cantoro, M. [1 ,2 ]
Wang, G. [1 ,3 ]
Lin, H. C. [1 ,3 ]
Klekachev, A. V. [1 ,2 ]
Richard, O. [1 ]
Bender, H. [1 ]
Kim, T. -G. [1 ,3 ]
Clemente, F. [1 ]
Adelmann, C. [1 ]
van der Veen, M. H. [1 ]
Brammertz, G. [1 ]
Degroote, S. [1 ]
Leys, M. [1 ]
Caymax, M. [1 ]
Heyns, M. M. [1 ,3 ]
De Gendt, S. [1 ,4 ]
机构
[1] IMEC, B-3001 Louvain, Belgium
[2] Katholieke Univ Leuven, Dept Phys & Astron, B-3001 Louvain, Belgium
[3] Katholieke Univ Leuven, Dept Met & Mat Engn, B-3001 Louvain, Belgium
[4] Katholieke Univ Leuven, Dept Chem, B-3001 Louvain, Belgium
关键词
III-V semiconductors; electronic transport; InAs; MOVPE; nanowires; Raman spectroscopy; III-V NANOWIRES; OPTOELECTRONIC DEVICES; SILICON NANOWIRES; EPITAXIAL-GROWTH; SCATTERING; TRANSISTORS;
D O I
10.1002/pssa.201026396
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, we show the results of experiments of InAs nanowire (NW) growth on (111)-oriented Si wafers. The NWs, grown at 620 degrees C by metal-organic vapor-phase epitaxy, are vertically aligned and similar to 30 nm in diameter. Their structural properties are studied by transmission electron microscopy, evidencing a polytypic character, and the vibrational properties by Raman spectroscopy. An assessment of their electrical transport properties is carried out by measuring back-gated, single InAs NW field-effect transistors. The absence of a catalyst ensures the compatibility of the NW growth process with current CMOS technology. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:129 / 135
页数:7
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