Stabilization of porous silicon electroluminescence by surface passivation with controlled covalent bonds

被引:85
|
作者
Gelloz, B [1 ]
Sano, H
Boukherroub, R
Wayner, DDM
Lockwood, DJ
Koshida, N
机构
[1] Tokyo Univ Agr & Technol, Dept Elect & Elect Engn, Tokyo 1848588, Japan
[2] Ecole Polytech, Phys Mat Condensee Lab, F-91128 Palaiseau, France
[3] Natl Res Council Canada, Ottawa, ON K1A 0R6, Canada
关键词
D O I
10.1063/1.1613812
中图分类号
O59 [应用物理学];
学科分类号
摘要
Stabilization of electroluminescence (EL) from nanocrystalline porous silicon (PS) diodes has been achieved by replacing silicon-hydrogen bonds terminating the surface of nanocrystalline silicon with more stable silicon-carbon (Si-C) and silicon-oxygen (Si-O-C) bonds without significant effects on the electrical properties. The surface modification is performed by a thermal treatment of partially and anodically oxidized PS sample at about 90 degreesC with organic molecules: 1-decene, ethyl undecylenate, or n-caprinaldehyde. The porous silicon device whose surface has been modified with stable covalent bonds shows no degradation in the EL efficiency and EL output intensity under dc operation for several hours. The improved stability can be attributed to the high chemical resistance of Si-C and Si-O-C bonds against current-induced surface oxidation associated with the generation of nonradiative defects. (C) 2003 American Institute of Physics.
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页码:2342 / 2344
页数:3
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