A study of voltage fluctuation, noise and magnetic instability in spin valve GMR recording heads

被引：16
|
作者：
Wallash, A [1 ]
机构：
[1] Quantum Corp, Milpitas, CA 95035 USA
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1998年 / 34卷 / 04期
关键词：
GMR; magnetic instability; noise; spin valve;
D O I：
10.1109/20.706579
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An abnormal voltage fluctuation in spin valve GMR recording heads is reported. Methodologies for detecting the fluctuation using a spin stand or an MR transfer curve tester are presented and used to study the phenomenon as a function of bias current and magnetic field, It is shown that the fluctuation only occurs within narrow ranges of sensor bias current, is suppressed by an external magnetic field and can result in a 7 dB increase in the noise floor at 10 MHz, Low field transfer curves show that the voltage fluctuation is the result of magnetic instability.
引用
收藏
页码：1450 / 1452
页数：3
相关论文
共 50 条
  • [31] The effects of EMI from cell phones on GMR magnetic recording heads and test equipment
    Kraz, V
    Wallash, A
    ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 2000, 2000, : 224 - 232
  • [32] Chemical mechanical nano-grinding of GMR magnetic recording heads for hard disk
    Shen, R. L.
    Zhou, L.
    Zhong, J.
    HDP'07: PROCEEDINGS OF THE 2007 INTERNATIONAL SYMPOSIUM ON HIGH DENSITY PACKAGING AND MICROSYSTEM INTEGRATION, 2007, : 194 - +
  • [33] Simulation study of synthetic antiferromagnetic biased spin valve heads by using semi-classical GMR theory
    Takagishi, M
    Komaki, K
    Hikami, F
    IEEE TRANSACTIONS ON MAGNETICS, 1999, 35 (05) : 2562 - 2564
  • [34] Spin-torque noise in CPP-GMR heads with current screen layer
    Katada, Hiroyuki
    Nakamoto, Kazuhiro
    Hoshiya, Hiroyuki
    Hoshino, Katsumi
    Yoshida, Nobuo
    IEEE TRANSACTIONS ON MAGNETICS, 2006, 42 (10) : 2450 - 2452
  • [35] MAGNETIC INSTABILITY OF THIN-FILM RECORDING-HEADS
    KLAASSEN, KB
    VANPEPPEN, JCL
    IEEE TRANSACTIONS ON MAGNETICS, 1994, 30 (02) : 375 - 380
  • [36] Electromigration reliability study of a GMR spin valve device
    Shingubara, S
    Takeda, Y
    Sakue, H
    Takahagi, T
    Verbruggen, AH
    MATERIALS RELIABILITY IN MICROELECTRONICS IX, 1999, 563 : 145 - 150
  • [37] Top, bottom, and dual spin valve recording heads with PdPtMn antiferromagnets
    Tanaka, A
    Shimizu, Y
    Kishi, H
    Nagasaka, K
    Kanai, H
    Oshiki, M
    IEEE TRANSACTIONS ON MAGNETICS, 1999, 35 (02) : 700 - 705
  • [38] Baseline popping of spin-valve recording heads induced by ESD
    Shen, Y
    Leung, RG
    Sun, JZF
    ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 2000, 2000, : 355 - 359
  • [39] INDUCTANCE FLUCTUATION, DOMAIN INSTABILITY AND POPCORN NOISE IN THIN-FILM HEADS
    LIU, FH
    KRYDER, MH
    IEEE TRANSACTIONS ON MAGNETICS, 1994, 30 (06) : 3885 - 3887
  • [40] Fabrication and recording study of all-metal dual-spin-valve CPP read heads
    Childress, J. R.
    Carey, M. J.
    Cyrille, M. -C.
    Carey, K.
    Smith, Neil
    Katine, J. A.
    Boone, T. D.
    Driskill-Smith, A. A. G.
    Maat, S.
    Mackay, K.
    Tsang, Ching H.
    IEEE TRANSACTIONS ON MAGNETICS, 2006, 42 (10) : 2444 - 2446
12345