Detection of nonmagnetic metal thin film using magnetic force microscopy

被引：3
|
作者：
Wakaya, Fujio [1 ]
Oosawa, Kenta [1 ]
Kajiwara, Masahiro [1 ,2 ]
Abo, Satoshi [1 ]
Takai, Mikio [1 ]
机构：
[1] Osaka Univ, Grad Sch Engn Sci, Ctr Sci & Technol Extreme Condit, 1-3 Machikaneyama, Toyonaka, Osaka 5608531, Japan
[2] Daihatsu Motor Co Ltd, Ikeda, Osaka, Japan
来源：
APPLIED PHYSICS LETTERS | 2018年 / 113卷 / 26期
关键词：
D O I：
10.1063/1.5079763
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a thin film of nonmagnetic metal. The results show good agreement with experimental data obtained by varying the tip height. The phenomenon analyzed here can be applied as a "metal detector" at the nanometer scale and for contactless measurements of sheet resistivity. The detection sensitivity is obtained as a function of oscillation frequency, thus allowing the determination of the best frequency for the phase-shift measurement. The shift in resonance frequency due to the presence of a nonmagnetic metal is also discussed. Published by AIP Publishing.
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页数：4
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