Speckle interferometry

被引:0
|
作者
Chiang, FP [1 ]
Jin, F [1 ]
Wang, Q [1 ]
Zhu, N [1 ]
机构
[1] SUNY Stony Brook, Dept Engn Mech, Lab Expt Mech Res, Stony Brook, NY 11794 USA
关键词
D O I
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中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Before the milestone work of Leedertz in 1970 coherent speckles generated from a laser illuminated object are considered noise to be eliminated or minimized. Leedertz shows that coherent speckles are actually information carriers. Since then the speckle technique has found many applications to fields of mechanics, metrology, nondestructive evaluation and material sciences. Speckles need not be coherent. Artificially created so-called white light speckles can also be used as information carriers. In this paper we present two recent developments of speckle technique with applications to micromechanics problems using SIEM (Speckle Interferometry with Electron Microscopy), to nondestructive evaluation of crevice corrosion and composite disbond and vibration of large structures using TADS (Time-Average Digital Specklegraphy).
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页码:177 / 190
页数:4
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