Optical fiber connector surface defect detection using wavelets

被引：0

作者：

Rehman, Atique ^{[1
]}

Bin Mozaffar, Waheed ^{[1
]}

机构：

[1] Int Islam Univ, Islamabad, Pakistan

来源：

ICIET 2007: PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON INFORMATION AND EMERGING TECHNOLOGIES | 2007年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

In this paper, a wavelet-based surface defect detection of optical fiber ferrules is proposed. Surface defects on optical fiber connectors can be damaging to passing signals when coupled with other connectors. Our quality control enhancement work is a visual control stage, using magnified images, whereby morphological operations segment the image and wavelet transforms then detect defects on optical fiber connector surfaces to improve the overall acceptability of the manufactured components.

引用

页码：200 / 205

页数：6

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