STRUCTURAL, ELECTRICAL AND OPTICAL PROPERTIES OF CdS THIN FILMS BY VACUUM EVAPORATION DEPOSITION

被引：0
|
作者：
Kathirvel, D. [1 ]
Suriyanarayanan, N. [2 ]
Prabahar, S. [3 ]
Srikanth, S. [3 ]
机构：
[1] Kalaignar Karunanidhi Inst Technol, Dept Phys, Coimbatore, Tamil Nadu, India
[2] Govt Coll Technol, Dept Phys, Coimbatore, Tamil Nadu, India
[3] Tamilnadu Coll Engn, Dept Phys, Coimbatore, Tamil Nadu, India
来源：
JOURNAL OF OVONIC RESEARCH | 2011年 / 7卷 / 04期
关键词：
CdS; Structural Properties; X-ray diffraction; Electrical Properties; TRANSISTORS;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Cadmium Sulphide thin films have been deposited on to well cleaned glass substrate in a vacuum of 10-6 Torr. The thickness of the films has been determined by quartz crystal monitor method. CdS thin film of lower thicknesses has amorphous structure and higher thickness has polycrystalline nature with cubic structure. The structural parameters such as interplannar distance (d), lattice constant (a), grain size (D), dislocation density and microstrain have been evaluated. The optical properties have been studied in the range of wavelength 300-900nm. It is observed that band gap energy is inversely depended on film thickness. The electrical resistivity measurements were performed at room temperature by four probe method and it shows CdS films with high ressitivity.
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页码：83 / 92
页数：10
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