Holographic microantenna array metrology

被引：4
|
作者：
Grossman, EN [1 ]
Luukanen, A [1 ]
Miller, AJ [1 ]
机构：
[1] Natl Inst Stand & Technol, Quantum Elect Metrol Div, Boulder, CO USA
来源：
Passive Millimeter-Wave Imaging Technology VIII | 2005年 / 5789卷
关键词：
microantenna; millimeter-wave; imaging; array; terahertz;
D O I：
10.1117/12.608839
中图分类号：
TB8 [摄影技术];
学科分类号：
0804 ;
摘要：
We describe a holographic or "phaseless" technique for measurement of complex antenna patterns that is particularly suited to planar antennas at very high frequencies - mm-wave thru long-wave infrared - where phase coherent detection is impractical. It has been implemented in a compact automated antenna range, and validated on a previously reported planar slot-ring antenna at 95 GHz. In the IR, the interferometric technique must be refined in order to reduce to acceptable levels the uncertainties due to positioning and alignment errors. This measurement of the complex antenna pattern is the most problematic part of a full accounting for the optical coupling efficiency "budget" in a microantenna-coupled, imaging sensor array.
引用
收藏
页码：44 / 50
页数：7
相关论文
共 50 条
  • [21] Experimental Confocal Imaging for Breast Cancer Detection Using Silicon on-Chip UWB Microantenna Array
    Kubota, S.
    Xiao, Xia
    Sasaki, N.
    Kimoto, K.
    Moriyama, W.
    Kikkawa, T.
    2008 IEEE ANTENNAS AND PROPAGATION SOCIETY INTERNATIONAL SYMPOSIUM, VOLS 1-9, 2008, : 2906 - 2909
  • [22] Array of holographic phase microelements
    Mikaelyan, A.L.
    Prokopenko, S.A.
    Palagushkin, A.N.
    Doklady Akademii Nauk, 2002, 384 (05) : 621 - 625
  • [23] Digital holographic metrology based on multi-angle interferometry
    Dong, Jun
    Jiang, Chao
    Jia, Shuhai
    OPTICS LETTERS, 2016, 41 (18) : 4301 - 4304
  • [24] Object conjugate reconstruction (OCR): a step forward in holographic metrology
    Barnhart, DH
    Halliwell, NA
    Coupland, JM
    PROCEEDINGS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2002, 458 (2025): : 2083 - 2097
  • [25] Optical metrology - Holographic method allows post-processing
    Bains, S
    LASER FOCUS WORLD, 2001, 37 (05): : 50 - +
  • [26] Volume holographic imaging for surface metrology at long working distances
    Sinha, A
    Sun, W
    Shih, T
    Barbastathis, G
    TWO- AND THREE-DIMENSIONAL VISION SYSTEMS FOR INSPECTION, CONTROL, AND METROLOGY, 2004, 5265 : 61 - 68
  • [27] Traceable Nanomechanical Metrology of GaN Micropillar Array
    Fatahilah, Muhammad Fahlesa
    Puranto, Prabowo
    Yu, Feng
    Langfahl-Klabes, Jannick
    Felgner, Andre
    Li, Zhi
    Xu, Min
    Pohlenz, Frank
    Strempel, Klaas
    Peiner, Erwin
    Brand, Uwe
    Waag, Andreas
    Wasisto, Hutomo Suryo
    ADVANCED ENGINEERING MATERIALS, 2018, 20 (10)
  • [28] Volume holographic imaging for surface metrology at long working distances
    Sinha, A
    Barbastathis, G
    OPTICS EXPRESS, 2003, 11 (24): : 3202 - 3209
  • [29] Preparation of Hole Array and Dot Array by Holographic Lithography System
    Ye, Zhen
    Wang, Yong
    Gao, Zhanqi
    Zhuang, Yunyi
    Zhang, Siyuan
    Hao, Yongqin
    Feng, Yuan
    Li, Zaijin
    Li, Yang
    Zhang, Jiabin
    Wang, Xiaohua
    2015 INTERNATIONAL CONFERENCE ON OPTOELECTRONICS AND MICROELECTRONICS (ICOM), 2015, : 422 - 426
  • [30] From Phased Array to Holographic Radar
    Cao, Siyang
    Zheng, Yuan F.
    Ewing, Robert L.
    PROCEEDINGS OF THE 2015 IEEE NATIONAL AEROSPACE AND ELECTRONICS CONFERENCE (NAECON), 2015, : 207 - 212
12345