Ptychographic imaging for the characterization of X-ray free-electron laser beams

被引：3

作者：

Sala, S. ^{[1
,2
,3
]}

Daurer, B. J. ^{[4
]}

Hantke, M. F. ^{[4
]}

Ekeberg, T. ^{[4
]}

Loh, N. D. ^{[5
]}

Maia, F. R. N. C. ^{[4
]}

Thibault, P. ^{[3
]}

机构：

[1] UCL, Dept Phys & Astron, London WC1E 6BT, England

[2] Diamond Light Source, Harwell Sci & Innovat Campus, Didcot OX11 O0E, Oxon, England

[3] Univ Southampton, Dept Phys & Astron, Southampton SO17 1BJ, Hants, England

[4] Uppsala Univ, Dept Cell & Mol Biol, S-75124 Uppsala, Sweden

[5] Natl Univ Singapore, Dept Phys, Singapore 117551, Singapore

来源：

X-RAY MICROSCOPY CONFERENCE 2016 (XRM 2016) | 2017年 / 849卷

基金：

瑞典研究理事会; 欧洲研究理事会;

关键词：

COHERENT; SCATTERING; FOCUS;

D O I：

10.1088/1742-6596/849/1/012032

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations between several pulses leads to a partially coherent average beam which can be decomposed into several coherent modes using ptychographic reconstruction algorithms. Such a decomposition can give insight into pulse-to-pulse variations of the wavefront. We discuss data collected at the Linac Coherent Light Source (LCLS) and FERMI.

引用

页数：4

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