Randomized test case generation for hybrid systems: metric selection

被引:0
|
作者
Esposito, JM [1 ]
机构
[1] USN Acad, Weapons & Syst Engn, Annapolis, MD 21403 USA
关键词
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
We are developing a randomized approach to test generation for hybrid systems, and control systems in general, using techniques from robotic path planning which have proved successful in solving high dimensional nonlinear problems. A critical component of the proposed algorithm is the choice of "metric" - how one decides the closeness of two states - which is nontrivial in the hybrid state space. In this paper we introduce four metrics for hybrid systems; and benchmark the algorithm using each of these metrics on a popular example problem from the literature and compare the impact of metric choice on computational efficiency.
引用
收藏
页码:236 / 240
页数:5
相关论文
共 50 条
  • [31] Systematic scenario test case generation for nuclear safety systems
    Tseng, Wan-Hui
    Fan, Chin-Feng
    [J]. INFORMATION AND SOFTWARE TECHNOLOGY, 2013, 55 (02) : 344 - 356
  • [32] Automated test case generation for the stress testing of multimedia systems
    Zhang, J
    Cheung, SC
    [J]. SOFTWARE-PRACTICE & EXPERIENCE, 2002, 32 (15): : 1411 - 1435
  • [33] Test Case Generation for Concurrent Systems Using Event Structures
    Athanasiou, Konstantinos
    Ponce-de-Leon, Hernan
    Schwoon, Stefan
    [J]. TESTS AND PROOFS, TAP 2015, 2015, 9154 : 19 - 37
  • [34] Information Systems Requirements Specification and Usage in Test Case Generation
    Sipaviciene, Neringa
    Smilgyte, Kristina
    Butleris, Rimantas
    [J]. INFORMATION AND SOFTWARE TECHNOLOGIES, ICIST 2014, 2014, 465 : 24 - 34
  • [35] Test Case Generation for Object-Oriented Systems: A Review
    Singh, Rajvir
    [J]. 2014 FOURTH INTERNATIONAL CONFERENCE ON COMMUNICATION SYSTEMS AND NETWORK TECHNOLOGIES (CSNT), 2014, : 981 - 989
  • [36] An experimental batch plant as a test case for the verification of hybrid systems
    Kowalewski, S
    Stursberg, O
    Bauer, N
    [J]. EUROPEAN JOURNAL OF CONTROL, 2001, 7 (04) : 366 - 381
  • [37] Efficient RTL coverage metric for functional test selection
    Kang, Jian
    Seth, Sharad C.
    Gangaram, Vijay
    [J]. 25TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2007, : 318 - +
  • [38] A test case generation tool for conformance testing of SDL systems
    Bourhfir, C
    Dssouli, R
    Aboulhamid, E
    Rico, N
    [J]. SDL'99: THE NEXT MILLENNIUM, 1999, : 405 - 419
  • [39] A test case generation approach for conformance testing of SDL systems
    Bourhfir, C
    Aboulhamid, E
    Dssouli, R
    Rico, N
    [J]. COMPUTER COMMUNICATIONS, 2001, 24 (3-4) : 319 - 333
  • [40] Test selection and coverage based on ctm and metric spaces
    Goga, Nicolae
    Moldoveanu, Horica
    Goga, Maria
    [J]. 2006 CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, VOLS 1-5, 2006, : 423 - +