Long-range scans and many-beam effects for high-resolution x-ray diffraction from multilayered structures: Experiment and theory

被引：4
|
作者：
Alexeeva, T. A. [1 ,2 ]
Benediktovich, A. I. [1 ]
Feranchuk, I. D. [1 ]
Baumbach, T. [2 ]
Ulyanenkov, A. [3 ]
机构：
[1] Belarusian State Univ, Dept Theoret Phys, Minsk 220030, BELARUS
[2] Univ Karlsruhe, D-76131 Karlsruhe, Germany
[3] Bruker AXS GmbH, D-76187 Karlsruhe, Germany
来源：
PHYSICAL REVIEW B | 2008年 / 77卷 / 17期
关键词：
D O I：
10.1103/PhysRevB.77.174114
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A covariant matrix method based on many-beam dynamical x-ray diffraction is reported for simulation of the wide x-ray diffraction profiles from multilayered crystalline samples both in coplanar and noncoplanar geometries. Because of many-wave scattering, the approximations of the second-order on x-ray polarizability both for dispersion equations and boundary conditions are taken into account. The influence of various factors on calculation of the x-ray profiles containing multiple Bragg reflections is investigated.
引用
收藏
页数：13
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