Long-range scans and many-beam effects for high-resolution x-ray diffraction from multilayered structures: Experiment and theory

被引：4

作者：

Alexeeva, T. A. ^{[1
,2
]}

Benediktovich, A. I. ^{[1
]}

Feranchuk, I. D. ^{[1
]}

Baumbach, T. ^{[2
]}

Ulyanenkov, A. ^{[3
]}

机构：

[1] Belarusian State Univ, Dept Theoret Phys, Minsk 220030, BELARUS

[2] Univ Karlsruhe, D-76131 Karlsruhe, Germany

[3] Bruker AXS GmbH, D-76187 Karlsruhe, Germany

来源：

PHYSICAL REVIEW B | 2008年 / 77卷 / 17期

关键词：

D O I：

10.1103/PhysRevB.77.174114

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A covariant matrix method based on many-beam dynamical x-ray diffraction is reported for simulation of the wide x-ray diffraction profiles from multilayered crystalline samples both in coplanar and noncoplanar geometries. Because of many-wave scattering, the approximations of the second-order on x-ray polarizability both for dispersion equations and boundary conditions are taken into account. The influence of various factors on calculation of the x-ray profiles containing multiple Bragg reflections is investigated.

引用

页数：13

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