Terahertz imaging and spectroscopy of large-area single-layer graphene

被引：104

作者：

Tomaino, J. L. ^{[1
]}

Jameson, A. D. ^{[1
]}

Kevek, J. W. ^{[1
]}

Paul, M. J. ^{[1
]}

van der Zande, A. M. ^{[2
]}

Barton, R. A. ^{[3
]}

McEuen, P. L. ^{[2
,4
]}

Minot, E. D. ^{[1
]}

Lee, Yun-Shik ^{[1
]}

机构：

[1] Oregon State Univ, Dept Phys, Corvallis, OR 97331 USA

[2] Cornell Univ, Atom & Solid State Phys Lab, Ithaca, NY 14853 USA

[3] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA

[4] Cornell Univ, Kavli Inst Cornell Nanoscale Sci, Ithaca, NY 14853 USA

来源：

OPTICS EXPRESS | 2011年 / 19卷 / 01期

基金：

美国国家科学基金会;

关键词：

FILMS;

D O I：

10.1364/OE.19.000141

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate terahertz (THz) imaging and spectroscopy of a 15 x 15-mm(2) single-layer graphene film on Si using broadband THz pulses. The THz images clearly map out the THz carrier dynamics of the grapheneon-Si sample, allowing us to measure sheet conductivity with sub-mm resolution without fabricating electrodes. The THz carrier dynamics are dominated by intraband transitions and the THz-induced electron motion is characterized by a flat spectral response. A theoretical analysis based on the Fresnel coefficients for a metallic thin film shows that the local sheet conductivity varies across the sample from sigma(s) = 1.7 x 10(-3) to 2.4 x 10(-3) Omega(-1) (sheet resistance, rho(s) = 420 - 590 Omega/sq). (C)2010 Optical Society of America

引用

页码：141 / 146

页数：6

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