Failure-mode analysis of high-power, single-mode, 980 mn, pump laser-diodes

被引：2
|
作者：
Chin, AK [1 ]
Wang, Z [1 ]
Luo, K [1 ]
Nelson, A [1 ]
Xu, Z [1 ]
机构：
[1] Axcel Photon Inc, Marlborough, MA 01752 USA
来源：
HIGH-POWER FIBER AND SEMICONDUCTOR LASERS | 2003年 / 4993卷
关键词：
D O I：
10.1117/12.473280
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This study examines catastrophic optical damage in failed, single-mode, 980 mn, InGaAs/GaAlAs/GaAs, ridge wave-guide. laser diodes. Analysis techniques were selected for their simplicity to provide quick evaluation of material and device quality. The analysis techniques are chemical etching, optical rnicroscopy, infrared microscopy, and scanning electron microscopy.
引用
收藏
页码：84 / 90
页数：7
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