An electron density measurement using an analyzer based imaging system

被引:2
|
作者
Bewer, Brian [1 ]
机构
[1] Univ Saskatchewan, Dept Anat & Cell Biol, Saskatoon, SK S7N 5E5, Canada
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2011年 / 646卷 / 01期
基金
加拿大自然科学与工程研究理事会;
关键词
Electronic density; Analyzer based imaging; X-ray refraction; DIFFRACTION;
D O I
10.1016/j.nima.2011.05.005
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Using a monochromatic X-ray beam from a synchrotron source the electron density of a homogeneous target was determined by measuring the refraction that occurs at the air-target interface for a known angle of incidence. The angle of deviation that these X-rays undergo at the transition between materials is micro-radian to submicro-radian in scale. Existing analyzer based imaging systems are designed to measure submicro-radian angle changes and commonly use monochromatic hard X-ray beams generated from synchrotron sources. A preliminary experiment using the analyzer based imaging apparatus at the Canadian Light Source Biomedical Imaging and Therapy beamline and a half cylinder shaped plastic target will be presented. By measuring the angle of deviation of the photon beam at several discrete angular positions of the target the electron density of the target material was determined. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:197 / 199
页数:3
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