Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

被引：15

作者：

Jones, Michael W. M. ^{[1
,2
,8
,9
]}

Phillips, Nicholas W. ^{[2
,3
]}

van Riessen, Grant A. ^{[4
]}

Abbey, Brian ^{[2
]}

Vine, David J. ^{[5
]}

Nashed, Youssef S. G. ^{[6
]}

Mudie, Stephen T. ^{[1
]}

Afshar, Nader ^{[1
]}

Kirkham, Robin ^{[7
]}

Chen, Bo ^{[2
]}

Balaur, Eugeniu ^{[2
]}

de Jonge, Martin D. ^{[1
]}

机构：

[1] Australian Synchrotron, 800 Blackburn Rd, Clayton, Vic 3168, Australia

[2] La Trobe Univ, La Trobe Inst Mol Sci, ARC Ctr Excellence Adv Mol Imaging, Bundoora, Vic 3086, Australia

[3] CSIRO Mfg, Parkville, Vic 3052, Australia

[4] La Trobe Univ, Dept Chem & Phys, La Trobe Inst Mol Sci, Bundoora, Vic 3086, Australia

[5] Argonne Natl Lab, Adv Photon Source, Xray Sci Div, Argonne, IL 60439 USA

[6] Argonne Natl Lab, Math & Comp Sci Div, Argonne, IL 60439 USA

[7] CSIRO Mfg, Clayton, Vic 3168, Australia

[8] Queensland Univ Technol, Fac Hlth, Brisbane, Qld 4000, Australia

[9] Queensland Univ Technol, Inst Hlth & Biomed Innovat, Brisbane, Qld 4000, Australia

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2016年 / 23卷

基金：

澳大利亚研究理事会;

关键词：

X-ray fluorescence; scanning X-ray diffraction microscopy; ptychography; PTYCHOGRAPHY; RESOLUTION; METALS;

D O I：

10.1107/S1600577516011917

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both stepand fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.

引用

页码：1151 / 1157

页数：7

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