Test Results of Proton Single-Event Effects Conducted by the Jet Propulsion Laboratory

被引：0
|
作者：
Allen, Gregory R. [1 ]
Irom, Farokh [1 ]
Vartanian, Sergeh [1 ]
机构：
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
来源：
2019 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2019年
基金：
美国国家航空航天局;
关键词：
D O I：
10.1109/redw.2019.8906643
中图分类号：
O35 [流体力学]; O53 [等离子体物理学];
学科分类号：
070204 ; 080103 ; 080704 ;
摘要：
This paper reports recent single-event effects results for a variety of microelectronic devices that include SRAM, FPGA, Flash Memory and a Linear Voltage Regulator. The data was collected to evaluate these devices for possible use in NASA missions.
引用
收藏
页码：113 / 116
页数：4
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