Optical spectroscopy methods for the characterization of sol-gel materials

被引:4
|
作者
Marques, Ana C. [1 ]
Rojas-Hernandez, Rocio Estefania [2 ]
Almeida, Rui M. [3 ]
机构
[1] Univ Lisbon, CERENA, DEQ, Inst Super Tecnico, Av. Rovisco Pais, P-1049001 Lisbon, Portugal
[2] Tallinn Univ Technol, Dept Mech & Ind Engn, Ehitajate 5, EE-19180 Tallinn, Estonia
[3] Univ Lisbon, Ctr Quim Estrutural, Inst Super Tecnico, Av. Rovisco Pais, P-1049001 Lisbon, Portugal
关键词
PLANAR WAVE-GUIDES; TIO2; THIN-FILMS; TEMPERATURE PHASE-FORMATION; PHOTONIC BANDGAP MATERIALS; RARE-EARTH; SILICA-TITANIA; FTIR SPECTROSCOPY; OXIDE NANOPARTICLES; INFRARED-ABSORPTION; CIRCULAR-DICHROISM;
D O I
10.1007/s10971-021-05592-0
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This paper reviews the main techniques of optical spectroscopy used for the characterization of sol-gel materials in different forms, including a brief description of instrumentation, followed by a series of selected examples from the literature that illustrate the main methodologies and results which can be obtained and including the main advantages and disadvantages of the different approaches adopted. The review includes separate sections on UV/Vis/NIR spectroscopy, spectroscopic ellipsometry, M-line spectroscopy, infrared and Raman spectroscopies, and photoluminescence spectroscopy.
引用
收藏
页码:1 / 43
页数:43
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