The impact of pulsed Electromagnetic Fault Injection on true random number generators

被引：10

作者：

Madau, Maxime ^{[1
]}

Agoyan, Michel ^{[1
]}

Balasch, Josep ^{[2
]}

Grujic, Milos ^{[2
]}

Haddad, Patrick ^{[1
]}

Maurine, Philippe ^{[3
]}

Rozic, Vladimir ^{[2
]}

Singelee, Dave ^{[2
]}

Yang, Bohan ^{[2
]}

Verbauwhede, Ingrid ^{[2
]}

机构：

[1] STMicroelectronics, Rousset, France

[2] Katholieke Univ Leuven, COSIC, Leuven, Belgium

[3] Lab Informat Robot & Microlect Montpellier, Montpellier, France

来源：

2018 WORKSHOP ON FAULT DIAGNOSIS AND TOLERANCE IN CRYPTOGRAPHY (FDTC) | 2018年

基金：

欧盟地平线“2020”;

关键词：

Pulse Electromagnetic fault Injection; True Random Number Generator; security guidelines;

D O I：

10.1109/FDTC.2018.00015

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

Random number generation is a key function of today's secure devices. Commonly used for key generation, random number streams are more and more frequently used as the anchor of trust of several countermeasures such as masking. True Random Number Generators (TRNGs) thus become a relevant entry point for attacks that aim at lowering the security of integrated systems. Within this context, this paper investigates the robustness of TRNGs based on Ring Oscillators (focusing on the delay chain TRNG) against pulsed electromagnetic fault injection. Indeed, weaknesses in generating random bits for masking scheme degenerate the Side Channel resistance. Finally by exploiting fault results on delay chain TRNG some general guidelines to harden them are derived.

引用

页码：43 / 48

页数：6

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