A HIGH-PRECISION ELLIPTICAL TARGET IDENTIFICATION METHOD FOR IMAGE SEQUENCES

被引:0
|
作者
Zheng, Shouzhu [1 ]
Chen, Peng [1 ]
Liu, Sicong [1 ]
Ma, Xiaolong [1 ,2 ]
Gao, Sa [1 ]
Tong, Xiaohua [1 ]
机构
[1] Tongji Univ, Coll Surveying & Geoinformat, Shanghai, Peoples R China
[2] Chinese Acad Surveying & Mapping, Inst Cartog & Geog Informat Syst, Beijing, Peoples R China
基金
中国国家自然科学基金;
关键词
Close-range videogrammetry; elliptical target; sub-pixel identification; Zernike moments;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Image sequences which obtained by close-range videogrammetry, have been widely used in the field of target identification and object tracking. The target identification is one of the key technologies and the corresponding requirement of identification precision are always at a high level in close-range videogrammetry. Therefore, this paper propose a high-precision target identification method for image sequences based on elliptical mark. The proposed approach adopts a coarse-to-fine strategy to identify elliptical mark based on pixel-level detection of Canny method and sub-pixel level identification of Zernike moments, which combines a series of constraint condition methods, thinning method and the least square fitting (LSF). In the process of coarse strategy, the constraint conditions of recursive segmentation method, morphological methods and shape feature are used to remove non-edge points caused by Canny identification. For the fine strategy, the reliable and accurate sub-pixel level edge points are identified by the thinning method and Zernike moments, and sub-pixel center position of elliptical mark are obtained by LSF method. Both simulation experiment and real experiment demonstrated that the proposed method can obtain high precision and reliability results of edge information and center position at a sub-pixel level, and its results are closer to the value by comparing the other two methods in simulation experiment.
引用
收藏
页码:3374 / 3377
页数:4
相关论文
共 50 条
  • [31] Generation of High-resolution and High-precision Depth Image
    Nishio, Koji
    Muraki, Yuta
    Kobori, Ken-ichi
    Kanaya, Takayuki
    2018 INTERNATIONAL WORKSHOP ON ADVANCED IMAGE TECHNOLOGY (IWAIT), 2018,
  • [32] High-precision accounting for high-precision network services
    Clemm, Alexander
    Strassner, John
    2021 IEEE 22ND INTERNATIONAL CONFERENCE ON HIGH PERFORMANCE SWITCHING AND ROUTING (IEEE HPSR), 2021,
  • [33] A High-Precision Flat Field Method Based on Image Stitching for Short Wavelength Instruments
    Gao, XingJun
    Chen, Bo
    He, LingPing
    Zheng, Xin
    SOLAR PHYSICS, 2020, 295 (02)
  • [34] A High-precision and Fast Image Forming Method for Borehole Camera Video of Rock Mass
    Zou, Xianjian
    Wang, Chuanying
    Song, Huan
    Gongcheng Kexue Yu Jishu/Advanced Engineering Sciences, 2021, 53 (04): : 158 - 167
  • [35] A high-precision image registration method for multi-channel single molecule localization
    Lin Dan-Ying
    Gong Zhen-Quan
    Huang Li-Lin
    Nie Meng-Jiao
    Yu Bin
    Qu Jun-Le
    ACTA PHYSICA SINICA, 2024, 73 (06)
  • [36] High-precision inhomogeneous image segmentation based on adaptive parameter level set method
    Yu, Haiping
    Ma, Kun
    Lin, Xiaoli
    Sun, Ping
    JOURNAL OF ADVANCED MECHANICAL DESIGN SYSTEMS AND MANUFACTURING, 2024, 18 (03): : JAMDSM0027
  • [37] A High-Precision Flat Field Method Based on Image Stitching for Short Wavelength Instruments
    XingJun Gao
    Bo Chen
    LingPing He
    Xin Zheng
    Solar Physics, 2020, 295
  • [38] Efficiency of algorithms for the high-precision digital image registration
    Pankova, T.L.
    Reznik, A.L.
    Avtometriya, 1991, (05): : 39 - 43
  • [39] High-precision microscopic autofocus with a single natural image
    Hua, Zhijie
    Zhang, Xu
    Tu, Dawei
    OPTICS EXPRESS, 2023, 31 (26) : 43372 - 43389
  • [40] Image charge shift in high-precision Penning traps
    Schuh, M.
    Heisse, F.
    Eronen, T.
    Ketter, J.
    Koehler-Langes, F.
    Rau, S.
    Sega, T.
    Quint, W.
    Sturm, S.
    Blaum, K.
    PHYSICAL REVIEW A, 2019, 100 (02)