Dual-Channel Microwave Scanning Probe Microscopy for Nanotechnology and Molecular Biology

被引：0

作者：

Fabiani, Silvia ^{[1
,2
,3
,4
,5
]}

Lucesoli, Agnese ^{[1
]}

di Donato, Andrea ^{[1
]}

Mencarelli, Davide ^{[1
]}

Venanzoni, Giuseppe ^{[1
]}

Morini, Antonio ^{[1
]}

Rozzi, Tullio ^{[1
]}

Farina, Marco ^{[1
]}

机构：

[1] Univ Politecn Marche, Dipartimento Bioingn Elettron & Telecomunicaz, I-60131 Ancona, Italy

[2] CNRS, LAAS, F-31077 Toulouse, France

[3] Univ Toulouse, F-31077 Toulouse, France

[4] UPS, INP ISAE, INSA, F-31077 Toulouse, France

[5] LAAS, F-31077 Toulouse, France

来源：

40TH EUROPEAN MICROWAVE CONFERENCE | 2010年

关键词：

Microwave Imaging; Microwave Measurement; Nanotechnology; Scanning Probe Microscopy;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this work we describe a new dual-channel scanning probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM). Our SMM system exploits the STM feedback to keep a suitable distance between probe and sample. The system is new because our SMM performs broadband measurements of the reflection coefficient across the STM probe by means of an external VNA with no resonant circuit. A post-processing algorithm reduces the noise by comparing images recorded at different close frequencies.

引用

页码：767 / 770

页数：4

共 50 条

[1] Development of a dual-channel scanning microwave/optical microprobe
Aga, RS
Brookman, J
Dizon, J
Wu, JZ
[J]. APPLIED PHYSICS LETTERS, 2004, 84 (11) : 1979 - 1981
[2] Scanning probe Microscopy for Nanotechnology
Bykov, VA
[J]. SEVENTH INTERNATIONAL SYMPOSIUM ON LASER METROLOGY APPLIED TO SCIENCE, INDUSTRY, AND EVERYDAY LIFE, PTS 1 AND 2, 2002, 4900 : 225 - 239
[3] Scanning probe microscopy and nanotechnology
Bykov, VA
[J]. MOLECULAR MANUFACTURING, 1996, 2 : 67 - 76
[4] SCANNING PROBE MICROSCOPY AND NANOTECHNOLOGY
LOMAS, M
ROBERTS, CJ
DAVIES, MC
JACKSON, DE
TENDLER, SJB
[J]. CHEMISTRY & INDUSTRY, 1993, (18) : 707 - 711
[5] SCANNING PROBE MICROSCOPY - TOOL FOR NANOTECHNOLOGY
VANSLAMBROUCK, TW
[J]. ADVANCED MATERIALS & PROCESSES, 1994, 146 (01): : 18 - 20
[6] Quantitative dual-channel FRET microscopy
Wei, Lichun
Zhang, Jiang
Mai, Zihao
Yang, Fangfang
Du, Mengyan
Lin, Fangrui
Qu, Junle
Chen, Tongsheng
[J]. OPTICS EXPRESS, 2017, 25 (21): : 26089 - 26102
[7] Scanning probe microscopy for bio & nanotechnology onboard the ISS
von Richter, A
Heckl, WM
Reiter, M
Lindner, R
[J]. PROCEEDINGS OF THE EUROPEAN SYMPOSIUM ON LIFE IN SPACE FOR LIFE ON EARTH, 2002, 501 : 285 - 288
[8] Scanning probe microscopy/spectroscopy and its applications for nanotechnology
Susla, B
Czajka, R
Szuba, S
Kaminski, M
Hihara, T
[J]. INTERNATIONAL CONFERENCE ON SOLID STATE CRYSTALS 2000: EPILAYERS AND HETEROSTRUCTURES IN OPTOELECTRONICS AND SEMICONDUCTOR TECHNOLOGY, 2001, 4413 : 182 - 187
[9] WSXM:: A software for scanning probe microscopy and a tool for nanotechnology
Horcas, I.
Fernandez, R.
Gomez-Rodriguez, J. M.
Colchero, J.
Gomez-Herrero, J.
Baro, A. M.
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (01):
[10] Nanotechnology and surface analysis using scanning probe microscopy
Gunther, E
Kragler, K
[J]. SIEMENS REVIEW, 1996, : 2 - 4

← 1 2 3 4 5 →