Characterisation of the GaAs-based intermediate band solar cell with multi-stacked InAs/InGaAs quantum dots

被引:7
|
作者
Rouis, W. [1 ]
Sayari, A. [2 ,3 ]
Nouiri, M. [4 ]
Ezzdini, M. [1 ]
Rekaya, S. [1 ]
El Mir, L. [4 ,5 ]
Sfaxi, L. [1 ,6 ]
Maaref, H. [1 ]
机构
[1] Univ Monastir, Lab Microoptoelect & Nanostruct, Tunis, Tunisia
[2] King Abdulaziz Univ, Fac Sci, Dept Phys, North Jeddah Branch, Jeddah, Saudi Arabia
[3] Fac Sci Tunis, Dept Phys, Equipe Spectroscopie Raman, Tunis 2092, Tunisia
[4] Gabes Univ, Fac Sci Gabes, Lab Phys Mat & Nanomat Appl Environm LaPHyMNE, Gabes, Tunisia
[5] Al Imam Mohammad Ibn Saud Islamic Univ IMSIU, Coll Sci, Dept Phys, Riyadh 11623, Saudi Arabia
[6] Univ Sousse, Ecole Super Sci & Technol Hammam Sousse, Sousse, Tunisia
关键词
quantum dot; solar cell; InAs/InGaAs; multi-stacking; NEGATIVE CAPACITANCE; IMPEDANCE SPECTROSCOPY; VOLTAGE; EFFICIENCY;
D O I
10.1504/IJNT.2015.068880
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report on both the photovoltaic and the optical properties of GaAs p-i-n solar cell (SC) and GaAs p-i-n SC with multiple InAs quantum dot (QD) layers in the i-region. Current-voltage and impedance spectroscopy measurements have been used to characterise the two SC devices. Refractive index, extinction and absorption coefficients were deduced from spectroscopic ellipsometry. I-V measurements in dark and illumination conditions have been carried out to investigate the photovoltaic effect in these devices. Our results suggested that the presence of trap states could cause the degraded photovoltaic performance of the QD SC device. The C-V characteristics of the QD SC device show forward bias region with negative values of capacitance, which is caused by the filling process of the dots near the junction. The equivalent circuit model consisting of two-series connected RC networks with a series resistance R-s was found to give a good fit to the experimental data.
引用
收藏
页码:584 / 596
页数:13
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