Structure and mechanical properties of nanostructured metal-carbon films

被引:0
|
作者
Pauleau, Y [1 ]
Thiery, F [1 ]
Pelletier, J [1 ]
Uglov, VV [1 ]
Kuleshov, AK [1 ]
Dub, SN [1 ]
Samtsov, MP [1 ]
机构
[1] CNRS, LEMD, Grenoble, France
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T [工业技术];
学科分类号
08 ;
摘要
Nanocrystalline copper/hydrogenated amorphous carbon (nc-Cu/a-C:H) films have been deposited on Si substrates by a microwave plasma-enhanced chemical vapor deposition process combined with a sputter deposition process. The deposition rate of films was found to vary in the range of 15 to 25 nm/min depending on the composition of argon-methane mixtures. These films were analyzed by Rutherford backscattering spectroscopy and Raman spectroscopy. The crystallographic structure, nanohardness, and friction coefficient of films were investigated as functions of the carbon content.
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页码:175 / 180
页数:6
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