A New Method to Verify the Accuracy of De-Embedding Algorithms

被引：0

作者：

Resso, Mike ^{[1
]}

Bogatin, Eric ^{[2
,3
]}

Vatsyayan, Aayushi ^{[3
]}

机构：

[1] Keysight Technol, Santa Rosa, CA 95403 USA

[2] Teledyne LeCroy, Boulder, CO USA

[3] Univ Colorado, Boulder, CO 80309 USA

来源：

2016 IEEE MTT-S LATIN AMERICA MICROWAVE CONFERENCE (LAMC) | 2016年

关键词：

2x thru; automatic fixture removal; de-embedding; high speed interconnects S-parameter measurements; relative accuracy; TDR; VNA;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

De-embedding is now an essential part of any measurement process for interconnect structures used in high speed applications. A great deal of mathematical manipulation of measured files is done to extract the device under test from the fixtures. This paper illustrates a procedure to evaluate any de-embedding process and a metric to quantify its accuracy and bandwidth.

引用

页数：4

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