Modeling and measurement of the dynamic performance of an ohmic contact-type RF MEMS switch

被引:0
|
作者
Guo, Z. J. [1 ]
McGruer, N. E. [1 ]
Adams, G. G. [2 ]
机构
[1] Northeastern Univ, Dept Elect & Comp Engn, Boston, MA 02115 USA
[2] Northeastern Univ, Dept Mech & Ind Engn, Boston, MA 02115 USA
关键词
RF MEMS switch; squeeze-film damping; slip-flow; nonlinear contact; adhesion;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A dynamic model has been developed to investigate the transient mechanical response of an ohmic contact-type RF MEMS switch. The model combines the built-in characteristics of a commercial finite element package and a finite difference method. The model includes a realistic geometry, the electrostatic actuation, two-dimensional squeeze-filin damping, slip-flow terms due to molecular effects, the nonlinear elastic contact, and the JKR adhesive force. The time-dependent characteristics of the microswitch, which include switching speed, electrostatic force, squeeze-film damping force, slip-flow, impact force, and contact tip bounce have been simulated using this model. Contact tip bounce is observed for a single-step actuation voltage whereas a properly tailored dual-actuation pulse can be used to eliminate bounce while maintaining a fast closing time. The slip-flow of the gas film between the two sides of the electrostatic actuator results in a larger correction at low actuation voltages than at high actuation voltages. The simulated results are in good agreement with experimental measurements of the microswitch.
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页数:2
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