Progress and Challenges in Terahertz Scanning Tunneling Microscopy

被引：0
|
作者：
Hegmann, Frank A. [1 ]
机构：
[1] Univ Alberta, Dept Phys, Edmonton, AB T6G 2E1, Canada
来源：
2018 43RD INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2018年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Coupling terahertz pulses to the sharp metal tip of a scanning tunneling microscope (THz-STM) has recently enabled imaging of ultrafast dynamics in materials with atomic spatial resolution. Progress in THz-STM, as well as current challenges and future directions, are discussed.
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