Optimization of an rf ion source for production of a high-energy ion microbeam

被引:4
|
作者
Kalinichenko, A [1 ]
Khomenko, V [1 ]
Lebed, S [1 ]
Mordik, S [1 ]
Voznij, V [1 ]
机构
[1] NATL ACAD SCI,INST PHYS APPL,UA-244007 SUMY,UKRAINE
关键词
D O I
10.1016/S0168-583X(96)00772-0
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A unit has been designed and implemented expressly for the measurement of brightness, energy spread and mass composition of the ion beam extracted from an ion source. This unit has been used for investigation of the main ion optical characteristics of standard and modified rf ion sources. A magnet system (''mirror'' type) consisting of permanent magnet and ferrite materials has been used in the modified rf ion source. The capabilities and advantages of this source are shown in this paper.
引用
收藏
页码:274 / 277
页数:4
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