Evolution of polymorphic self-checking circuits

被引:0
|
作者
Sekanina, Lukas [1 ]
机构
[1] Brno Univ Technol, Fac Informat Technol, Brno 61266, Czech Republic
关键词
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暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This paper presents elementary circuit components which exhibit self-checking properties; however, which do not utilize any additional signals to indicate the fault. The fault is indicated by generating specific values at some of standard outputs of a given circuit. In particular, various evolved adders containing conventional as well as polymorphic gates are proposed with less than duplication overhead which are able to detect a reasonable number of stuck-at-faults by oscillations at the carry-out output when the control signal of polymorphic gates oscillates.
引用
收藏
页码:186 / 197
页数:12
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