RF Imaging, Architectures, and Applications: introduction to the feature issue

被引：0
|
作者：
Krapels, Keith A. [2 ]
Salmon, Neil A. [3 ]
Wikner, David A. [4 ]
Schuetz, Christopher A. [1 ]
机构：
[1] Phase Sensit Innovat Inc, Newark, DE 19711 USA
[2] USA, Night Vis & Elect Sensors Directorate, Ft Belvoir, VA 22060 USA
[3] QinetiQ, Malvern WR14 3PS, Worcs, England
[4] USA, Sensors & Electron Devices Directorate, Res Lab, Adelphi, MD 20783 USA
来源：
APPLIED OPTICS | 2010年 / 49卷 / 19期
关键词：
D O I：
10.1364/AO.49.00RFI1
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This Applied Optics feature issue spotlights developments in the emerging areas of millimeter, submillimeter, and terahertz imaging. © 2010 Optical Society of America.
引用
收藏
页码：RFI1 / RFI1
页数：1
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