Behavioral modeling of digital devices via composite local linear state-space relations

被引:9
|
作者
Stievano, Igor S. [1 ]
Siviero, Claudio [1 ]
Canavero, Flavio G. [1 ]
Maio, Ivan A. [1 ]
机构
[1] Politecn Torino, Dipartimento Elettron, I-10129 Turin, Italy
关键词
circuit modeling; digital ICs; electromagnetic compatibility (EMC); I/O ports; macromodeling; signal integrity; system identification;
D O I
10.1109/TIM.2008.925343
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper addresses the generation of accurate and efficient behavioral models of digital ICs. The proposed approach is based on the approximation of the device port characteristics by means of composite local linear state-space relations whose parameters can effectively be estimated from device port transient responses via well-established system identification techniques. The proposed models have been proven to overcome some inherent limitations of the state-of-the-art models used so far, and they can effectively be implemented in any commercial tool as Simulation Program with Integrated Circuit Emphasis (SPICE) subcircuits or VHDL-AMS hardware descriptions. A systematic study of the performances of the proposed state-space models is carried out on a synthetic test device. The effectiveness of the proposed approach has been demonstrated on a real application problem involving commercial devices and a data link of a mobile phone.
引用
收藏
页码:1757 / 1765
页数:9
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