Streak detection in mottled and noisy images

被引:5
|
作者
Rosario, Hector Santos [1 ]
Saber, Eli
Wu, Wencheng [3 ]
Chandu, Kartheek [2 ]
机构
[1] MKS Instruments, Rochester, NY 14623 USA
[2] Rochester Inst Technol, Dept Elect Engn, Rochester, NY 14623 USA
[3] Xerox Corp, Webster, NY 14580 USA
关键词
D O I
10.1117/1.2816444
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We describe a method for automatically detecting streaks in printed images using adaptive window-based image projections and mutual information. The proposed approach accepts a scanned image enclosing the defect and computes the projections across the entire image at different window sizes. The resulting traces collected from the projections are analyzed with a peak detection algorithm and subsequently correlated using normalized mutual information to pinpoint the location and width of streak(s). Finally, for a given peak, the window size is changed adaptively to identify and locate the intensity and length of the corresponding streak(s) while maximizing the signal-to-noise ratio. Results on synthetic and real-life images are provided to demonstrate the effectiveness of our proposed technique. (c) 2007 SPIE and IS&T.
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页数:14
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