Effect of Ba substitution on the microstructure and electrical conductivity of BaxSr1-xRuO3 thin films prepared by laser ablation

被引:3
|
作者
Ito, Akihiko [1 ]
Masumoto, Hiroshi [2 ]
Goto, Takashi [2 ]
机构
[1] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 9808577, Japan
[2] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan
关键词
laser ablation; strontium ruthenate; barium ruthenate; thin films; substitution effect; microstructure; electrical conductivity;
D O I
10.2109/jcersj2.116.441
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
BaxSr1-xRuO3 (BSRO) thin films were prepared by laser ablation on quartz substrates at a substrate temperature (T-sub) Of 973 K and an oxygen pressure (Po-2) of 13 Pa. The effect of Ba substitution for Sr on the microstructure and electrical conductivity (sigma) was investigated. (110)-oriented pseudo-cubic BSRO thin films were obtained at a Ba substitution ratio (x) below 0.5. The thin films prepared at x = 0.6 to 0.8 had the 4H-type BaRuO3 (BRO) structure, whereas 9R BRO thin films were obtained at x = 1.0. The BSRO thin films consisted of well-crystallized fine grains. The pseudo-cubic lattice parameter of the BSRO thin films increased linearly from 0.393 to 0.407 with increasing x. The BSRO thin films showed metallic conduction, and the sigma decreased due to lattice expansion with increasing chi. (C) 2008 The Ceramic Society of Japan. All rights reserved.
引用
收藏
页码:441 / 444
页数:4
相关论文
共 50 条
  • [41] Effect of (Ba,Sr) and (Mn,Fe,W) dopants on the microwave properties of BaxSr1-xTiO3 thin films
    Chang, Wontae
    Horwitz, James S.
    Kim, Won-Jeong
    Pond, Jeffrey M.
    Kirchoefer, Steven W.
    Chrisey, Douglas B.
    Materials Research Society Symposium - Proceedings, 1999, 541 : 699 - 704
  • [42] Optical and electrical conductivity of La0.8Sr0.2MnO3 thin films deposited by laser ablation
    Coulon, J
    Hassini, A
    Gervais, M
    Douy, A
    Champeaux, C
    Lecomte, J
    Ammor, L
    Catherinot, A
    Quoirin, JB
    Gervais, F
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2001, 83 (1-3): : 227 - 230
  • [43] Microstructure and electrical properties of lead zirconate titanate thin films deposited by excimer laser ablation
    Wang, ZJ
    Maeda, R
    Ichiki, M
    Kokawa, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2001, 40 (9B): : 5523 - 5527
  • [44] Electrical properties of thin BaxSr1-xTiO3 films on silicon dioxide substrates
    Razumov, SV
    Tumarkin, AV
    Sysa, MV
    Gagarin, AG
    TECHNICAL PHYSICS LETTERS, 2003, 29 (03) : 175 - 177
  • [45] Electrical properties of thin BaxSr1−xTiO3 films for microwave applications
    S. V. Razumov
    A. V. Tumarkin
    Technical Physics Letters, 2000, 26 : 705 - 706
  • [46] EFFECT OF LASER RADIATION ON ELECTRICAL-CONDUCTIVITY OF THIN SUPERCONDUCTING ALUMINUM FILMS
    LECHEVET, JN
    MORELLI, L
    LEOPOLD, L
    GREGORY, WD
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (04): : 438 - 438
  • [47] Microstructure and optical properties of Ba0.6Sr0.4TiO3 thin films prepared by pulsed laser deposition
    Vigneshwaran, B.
    Kuppusami, P.
    Panda, Arunkumar
    Singh, Akash
    Sreemoolanadhan, H.
    MATERIALS RESEARCH EXPRESS, 2018, 5 (06)
  • [48] Structure and microstructure of La1-xCaxMnO3-δ thin films prepared by pulsed laser deposition
    Lebedev, OI
    Van Tendeloo, G
    Amelinckx, S
    Leibold, B
    Habermeier, HU
    PHYSICAL REVIEW B, 1998, 58 (12): : 8065 - 8074
  • [49] Microstructural and electrical properties of (BaxSr1-x)Ti1+yO3+z thin films prepared by RF magnetron sputtering
    Baniecki, JD
    Shioga, T
    Kurihara, K
    INTEGRATED FERROELECTRICS, 2002, 46 : 221 - 232
  • [50] The oxygen deficiency effect of VO2 thin films prepared by laser ablation
    M. Nagashima
    H. Wada
    Journal of Materials Research, 1997, 12 : 416 - 422