Scanning probe microscopy (STM, AFM) investigation of carbon nanotubes

被引：0
|
作者：
Biró, LP [1 ]
机构：
[1] Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary
来源：
FRONTIERS OF NANO-OPTOELECTRONIC SYSTEMS | 2000年 / 6卷
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The image formation in scanning tunneling microscopy (STM), atomic force microscopy (AFM), and the particularities of imaging supported carbon nanotubes by STM and AFM are discussed. The milestones of STM, STS, and AFM measurements on carbon nanotubes are briefly reviewed. Scanning tunneling spectroscopy (STS) measurements, and atomic resolution images of single-wall and multi-wall carbon nanotubes supported on graphite are compared to typical data for graphite.
引用
收藏
页码：405 / 420
页数：16
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