High Bandwidth Active Gate Driver for Simultaneous Reduction of Switching Surge and Switching Loss of SiC-MOSFET

被引:0
|
作者
Noge, Yuichi [1 ]
Shoyama, Masahito [1 ]
机构
[1] Kyushu Univ, Dept Elect & Elect Engn, Fukuoka, Japan
基金
日本科学技术振兴机构;
关键词
double pulse test; gate drive; SiC MOSFET; switching loss;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
This paper investigates an active gate driver (AGD) for an SiC-MOSFET. The source current feedback type active gate driver utilizes the reactive voltage of the source wire inductance as a negative feedback signal to regulate the source current di/dt. Recently, the improvement of the switching performance of the AGD is limited due to the feedback system bandwidth. In this paper, a high bandwidth current feedback type power operational amplifier is applied as the gate drive circuit. Switching characteristics of the conventional resistive gate driver and the active gate driver are experimentally investigated by a double pulse test setup. The switching setup condition is 700 V / 80 A. This paper describes the construction of the AGD circuit and the experimental results. The over-shoot and ringing of the V-ds and I-s are reduced by using the active gate driver. In addition, the switching loss is simultaneously reduced.
引用
收藏
页码:2097 / 2103
页数:7
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