An Active Gate Driver for Improving Switching Performance of SiC MOSFET

被引:0
|
作者
Li X. [1 ]
Lu Y. [1 ]
Ni X. [1 ]
Wang S. [1 ]
Zhang Y. [1 ]
Tang X. [1 ]
机构
[1] Nanjing Institute of Technology, Nanjing
关键词
Active gate driver; Oscillation; Overshoot; Silicon carbide metal oxide semiconductor field effect transistor (SiC MOSFET);
D O I
10.13334/j.0258-8013.pcsee.200639
中图分类号
学科分类号
摘要
Compared with silicon metal oxide semiconductor field effect transistor, silicon carbide metal oxide semiconductor field effect transistor has higher breakdown voltage, lower on-resistance, faster switching speed and higher operating temperature; therefore, it has been widely used in photovoltaic inverters, electric vehicles and wind power generation. However, the high switching speed of SiC MOSFET will cause current and voltage overshoot and oscillation during switching process. This will not only increases the switching loss of the device, but also may cause damage to the device. This article first analyzed the switching process of the SiC MOSFET in detail, and obtained the generation mechanism of current and voltage overshoot and oscillation during switching process. An active gate driver was designed based on the key factors affecting current and voltage overshoot and oscillation. The designed active gate driver can increase the driving resistance and reduce the gate current in a specific stage during switching process to suppress current and voltage overshoot and oscillation. The experimental results show that, compared with the traditional gate driver, the designed active gate driver can effectively suppress the current and voltage overshoot and oscillation of the device under different driving resistance, different load current and different SiC MOSFET. © 2020 Chin. Soc. for Elec. Eng.
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页码:5760 / 5769
页数:9
相关论文
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