Hetero-gate-Dielectric Symmetric U-shaped gate tunnel FET

被引:14
|
作者
Tajally, Mohammad Bagher [1 ]
Karami, Mohammad Azim [1 ]
机构
[1] Iran Univ Sci & Technol, Sch Elect Engn, Tehran 1684613114, Iran
关键词
Tunnel FET (TFET); High-k dielectric; Gate dielectric engineering; FIELD-EFFECT TRANSISTORS; AMBIPOLAR BEHAVIOR;
D O I
10.1016/j.spmi.2017.08.051
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Heterogeneous gate dielectric is used in a nanoscale symmetric U-shaped gate tunnel FET (SUTFET), which resulted in I-ON, I-OFF. subthreshold swing (SS), and I-ambipolar enhancement. I-ON of 1.5 x 10(-5) A/mu m, I-OFF of 6 x 10(-12) A/mu m, average subthreshold swing of (SS) 19.83 mV/decade from 0 V < V-GS < V-Threshold, and I-ambipolar of 5 x 10(-9) A/mu m are obtained by using high-k dielectric close to the source and low-k dielectric in the vicinity of drain. The gate dielectric engineering shows characteristic enhancement in compare to SUTFET with single gate dielectric material. The strong coupling between the gate and transistor channel near the source results in reduced potential barrier width in tunnel junction, which leads to higher I-ON and lower subthreshold swing. Moreover, the presence of low-k dielectric near the drain reduces ambipolar current by increasing potential barrier height. This improved SUTFET characteristics makes it suitable for the usage in digital circuits due to reduced ambipolar response. (C) 2017 Elsevier Ltd. All rights reserved.
引用
收藏
页码:139 / 145
页数:7
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