Novel Solution Process for High-Mobility C60 Fullerene Field-Effect Transistors

被引:11
|
作者
Kang, Woogun [1 ,2 ]
Kitamura, Masatoshi [1 ,3 ]
Arakawa, Yasuhiko [1 ,2 ]
机构
[1] Univ Tokyo, Inst Nano Quantum Informat Elect NanoQuine, Meguro Ku, Tokyo 1538505, Japan
[2] Univ Tokyo, Inst Ind Sci IIS, Meguro Ku, Tokyo 1538505, Japan
[3] Kobe Univ, Dept Elect & Elect Engn, Grad Sch Engn, Kobe, Hyogo 6578501, Japan
关键词
THIN-FILM TRANSISTORS;
D O I
10.1143/APEX.4.121602
中图分类号
O59 [应用物理学];
学科分类号
摘要
Solution-processed C-60 fullerene field-effect transistors with high electron mobility were demonstrated by using a novel drying process. Highly uniform and flat C-60 layers were prepared from a C-60 solution when the solution was rapidly dried in a vacuum chamber. Field-effect transistors with solution-deposited C-60 active layers showed electron mobility of up to 0.86 cm(2) V-1 s(-1), threshold voltage of 3 V, subthreshold slope of 0.67 V/decade, and a current on/off ratio of 4 x 10(6). The mobilities of solution-deposited C-60 transistors were comparable to those of vacuum-deposited C-60 transistors. (C) 2011 The Japan Society of Applied Physics
引用
收藏
页数:3
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