Diffraction and scattering studies using high brightness Excillum MetalJet X-ray sources

被引：0
|
作者：
Adibhatla, A. [1 ]
Hallstedt, J. [1 ]
机构：
[1] Excillum Inc, Stockholm, Sweden
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2021年 / 77卷
关键词：
D O I：
10.1107/S0108767321099943
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：A5 / A5
页数：1
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