Empirical bayes estimation of reliability in a positive exponential family

被引:4
|
作者
Liang, Tachen [1 ]
机构
[1] Wayne State Univ, Dept Math, Detroit, MI 48202 USA
关键词
asymptotically optimal; rate of convergence; regret; reliability;
D O I
10.1080/03610920701853579
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
We study empirical Bayes estimation of reliability in a lifetime distribution having probability density f(y|theta)=alpha y(alpha upsilon-1) exp(-y(alpha)/theta)/[Gamma(v)theta(v)], where 0 <theta(1)<theta <theta(2)<infinity for some known constants theta(1) and theta(2). An empirical Bayes estimator (phi(n)) over tilde is constructed and its associated asymptotic optimality is studied. It is shown that (phi(n)) over tilde is asymptotically optimal, and the regret of (phi(n)) over tilde converges to zero at a rates O(ln(2)n/n) (for 0 < v < 1/2 or v =1 cases) or O(ln(2v+v) n/n) (for 1/2 <= v <= 1 or v > 1 and v*=max(1,v) cases), where n is the number of past data available when the estimation problem is considered.
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页码:2052 / 2065
页数:14
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