Improving the efficiency of counting defects by learning RBF nets with MAD loss

被引:0
|
作者
Rafajlowicz, Ewaryst [1 ]
机构
[1] Wroclaw Univ Technol, Inst Comp Engn Control & Robot, PL-50370 Wroclaw, Poland
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中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The method of using a lateral histogram for evaluating the number of holes (e.g., defects) from images is known to be fast but rather inaccurate. Our aim is to propose a method of improving its performance by learning, but keeping the speed of the original method. This task is accomplished by considering a multiclass pattern recognition problem with linearly ordered labels and a loss function, which measures absolute deviations of decisions from true classes.
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页码:146 / 153
页数:8
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