Low energy background in mercuric iodide X-ray spectrometers

被引:1
|
作者
Bao, XJ
Natarajan, M
Henderson, J
机构
[1] Dept. of Analytical Instruments, TN Technologies, Inc., Round Rock, TX 78680
关键词
D O I
10.1016/S0168-9002(96)00328-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The origins of the continuous background (window effect or dead layer) in mercuric iodide X-ray spectrometers are investigated. It is found that photo-electron escape and carrier diffusion are the dominant mechanisms of incomplete charge collection in the energy range of interest (from 3-60 keV). X-ray spectra measurements, computer calculation and photo-response measurements are presented in support of the proposed model. Many observations of detector behavior made in the manufacturing and application of mercuric iodide X-ray detectors can be explained by this model.
引用
收藏
页码:58 / 61
页数:4
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