共 50 条
- [35] A novel ellipsometer for measuring thickness of oxide layer on the surface of silicon sphere - art. no. 683443 [J]. OPTICAL DESIGN AND TESTING III, PTS 1 AND 2, 2008, 6834 : 83443 - 83443
- [37] Surface structure of GaAs(2511) -: art. no. 155308 [J]. PHYSICAL REVIEW B, 2002, 65 (15) : 1 - 13
- [38] Kinetic model for surface reconstruction -: art. no. 011603 [J]. PHYSICAL REVIEW E, 2002, 66 (01): : 1 - 011603
- [40] Surface effects in magnetic microtraps -: art. no. 041604 [J]. PHYSICAL REVIEW A, 2002, 66 (04): : 4