Identifying Explosives by Dielectric Properties Obtained Through Wide-Band Millimeter-Wave Illumination

被引：9
|
作者：
Weatherall, James C. [1 ]
Barber, Jeffrey [1 ]
Smith, Barry T. [2 ]
机构：
[1] Battelle Mem Inst, Egg Harbor Township, NJ 08234 USA
[2] US Dept Homeland Secur, S&T Directorate, Transportat Secur Lab, WJ Hughes Tech Ctr, Atlantic City, NJ 08405 USA
来源：
PASSIVE AND ACTIVE MILLIMETER-WAVE IMAGING XVIII | 2015年 / 9462卷
关键词：
Millimeter wave measurement; reflectometry; parameter extraction; dielectric measurement; detection algorithms; explosives detection;
D O I：
10.1117/12.2177216
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A method for extracting dielectric constant from free-space 18 - 40 GHz millimeter-wave reflection data is demonstrated. The reflection coefficient is a function of frequency because of propagation effects, and numerically fitting data to a theoretical model based on geometric optics gives a solution for the complex dielectric constant and target thickness. The discriminative value is illustrated with inert substances and military sheet explosive. In principle, the measurement of reflectivity across multiple frequencies can be incorporated into Advanced Imaging Technology (AIT) systems to automatically identify the composition of anomalies detected on persons at screening checkpoints.
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收藏
页数：9
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