Determination of impurity lattice sites in single crystals using PIXE channeling

被引：0

作者：

Kling, A

Soares, JC

da Silva, MF

Rebouta, L

Kollewe, D

Krause, H

Flagmeyer, RH

Vogt, J

机构：

[1] Univ Nova Lisboa, Ctr Fis Nucl, P-1669 Lisbon, Portugal

[2] ITN, Dept Fis, P-2685 Sacavem, Portugal

[3] Univ Minho, Dept Fis, P-4719 Braga, Portugal

[4] Univ Stuttgart, Inst Strahlenphys, D-70550 Stuttgart, Germany

[5] Univ Leipzig, Fak Phys & Geowissensch, Abt Nukl Festkorperphys, D-04103 Leipzig, Germany

来源：

X-RAY SPECTROMETRY | 1999年 / 28卷 / 02期

关键词：

D O I：

10.1002/(SICI)1097-4539(199903/04)28:2<105::AID-XRS318>3.0.CO;2-R

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The channeling technique is an interesting and powerful tool for the determination of impurity lattice sites in single crystals, Since the investigation of light impurities in heavy matrices using the Rutherford backscattering spectrometry/channeling technique is often very difficult or impossible, the combination of particle induced x-ray emission (PIXE) with the channeling effect is an important alternative, Experimental results for various impurities in cubic and non-cubic crystals are presented to show the feasibility of the method, In order to permit the quantitative analysis of such PIXE/channeling data, the computer code CASSIS was developed and successfully applied, Copyright (C) 1999 John Wiley & Sons, Ltd.

引用

页码：105 / 109

页数：5

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