Transverse magnetoresistance of the two-dimensional chiral metal

被引:23
|
作者
Chalker, JT
Sondhi, SL
机构
[1] Univ Oxford, Oxford OX1 3NP, England
[2] Princeton Univ, Dept Phys, Princeton, NJ 08544 USA
来源
PHYSICAL REVIEW B | 1999年 / 59卷 / 07期
基金
美国国家科学基金会;
关键词
D O I
10.1103/PhysRevB.59.4999
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We consider the two-dimensional chiral metal, which exists at the surface of a layered, three-dimensional sample exhibiting the integer quantum Hall effect. We calculate its magnetoresistance in response to a component of magnetic field perpendicular to the sample surface, in the low temperature, but macroscopic, regime where inelastic scattering may be neglected. The magnetoresistance is positive, following a Drude form with a field scale B-0 = Phi(0)/al(el) given by the transverse field strength at which one quantum of flux Phi(0) passes through a rectangle with sides set by the layer-spacing a and the elastic mean free path l(el). Experimental measurement of this magnetoresistance may, therefore, provide a direct determination of the elastic mean free path in the chiral metal. [S0163-1829(99)05807-5].
引用
收藏
页码:4999 / 5002
页数:4
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