Frequency comb metrology in the extreme ultraviolet

被引：0

作者：

Kandula, D. Z. ^{[1
]}

Gohle, Ch. ^{[1
]}

Pinkert, T. J. ^{[1
]}

Morgenweg, J. ^{[1
]}

Barmes, I. ^{[1
]}

Ubachs, W. ^{[1
]}

Eikema, K. S. E. ^{[1
]}

机构：

[1] Vrije Univ Amsterdam, LaserLaB Amsterdam, NL-1081 HV Amsterdam, Netherlands

来源：

2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2011年

关键词：

PRECISION SPECTROSCOPY; GROUND-STATE; LAMB SHIFT;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Frequency comb generation and excitation of argon, neon, and helium is shown from 51 to 85 nm with amplified and harmonically upconverted comb laser pulses, resulting in an 8-fold improved helium ground state ionization energy.

引用

页数：3

共 50 条

[31] The Schawlow-Townes limit in frequency comb metrology
Steinmeyer, Guenter
2021 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC), 2021,
[32] FREQUENCY MIXING IN THE EXTREME ULTRAVIOLET
REINTJES, J
APPLIED OPTICS, 1980, 19 (23): : 3889 - 3896
[33] Extreme ultraviolet lithography resist-based aberration metrology
Fenger, Germain L.
Sun, Lei
Raghunathan, Sudharshanan
Wood, Obert R.
Smith, Bruce W.
JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2013, 12 (04):
[34] Metrology related to the multilayer mirrors in an extreme-ultraviolet stepper
Tarrio, C.
Hill, S. B.
Ermanoski, I.
Lucatorto, T. B.
Madey, T. E.
Chandhok, M.
Fang, M.
FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007, 2007, 931 : 428 - +
[35] Realisation of the metre by optical frequency comb: applications in length metrology
Ferreira-Barragans, S.
Mar Perez-Hernandez, Ma
Samoudi, B.
Prieto, E.
INTERNATIONAL CONFERENCE ON APPLICATIONS OF OPTICS AND PHOTONICS, 2011, 8001
[36] Operation of an optically coherent frequency comb outside the metrology lab
Sinclair, L. C.
Coddington, I.
Swann, W. C.
Rieker, G. B.
Hati, A.
Iwakuni, K.
Newbury, N. R.
OPTICS EXPRESS, 2014, 22 (06): : 6996 - 7006
[37] XUV frequency-comb metrology on the ground state of helium
Kandula, Dominik Z.
Gohle, Christoph
Pinkert, Tjeerd J.
Ubachs, Wim
Eikema, Kjeld S. E.
PHYSICAL REVIEW A, 2011, 84 (06):
[38] METROLOGY Frequency-comb laser measures long distances
Overton, Gail
LASER FOCUS WORLD, 2009, 45 (09): : 15 - 16
[39] Advanced Length Metrology exploiting the Frequency Comb of a Femtosecond Laser
Kim, Young-Jin
Jin, Jonghan
Kim, Yunseok
Hyun, Sangwon
Kim, Seung-Woo
2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9, 2008, : 2227 - 2228
[40] Optical frequency comb for high-resolution and precision metrology
Nogueira, Giovana T.
Cruz, Flavio C.
2007 SBMO/IEEE MTT-S INTERNATIONAL MICROWAVE AND OPTOELECTRONICS CONFERENCE, VOLS 1 AND 2, 2007, : 644 - 647

← 1 2 3 4 5 →